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IEEE Transactions on Device and Materials Reliability

Source type:	Journal	Print ISSN:	1530-4388
Publisher:	Institute of Electrical and Electronics Engineers Inc.	Electronic ISSN:	1558-2574
Areas:	Electrical and Electronic Engineering , Safety, Risk, Reliability and Quality , Electronic, Optical and Magnetic Materials

Indicator:

Year	P	IPP	SNIP	% self cit
2002	24	0.83	1.46	0.0%
2003	37	1.11	1.60	0.0%
2004	66	1.24	1.06	17.1%
2005	126	1.36	1.29	11.7%
2006	193	1.78	1.54	7.8%
2007	237	1.83	1.64	7.8%
2008	224	1.86	1.65	9.1%
2009	224	1.62	1.46	6.9%
2010	219	1.42	1.39	6.8%
2011	207	2.04	1.69	8.5%
2012	198	1.77	1.69	8.0%
2013	210	1.62	1.43	4.1%
2014	217	2.07	1.65	16.3%
2015	294	1.88	1.32	9.4%
2016	298	1.51	1.26	7.6%
2017	323	1.59	1.11	10.1%
2018	273	1.46	1.08	5.8%
2019	268	1.57	1.14	6.2%
2020	278	1.80	1.10	7.4%
2021	272	1.94	1.22	6.6%
2022	273	2.00	1.08	3.5%