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Microelectronics Reliability

Source type:	Journal	Print ISSN:	0026-2714
Publisher:	Elsevier Ltd.	Electronic ISSN:
Areas:	Electrical and Electronic Engineering , Safety, Risk, Reliability and Quality , Electronic, Optical and Magnetic Materials , Surfaces, Coatings and Films , Condensed Matter Physics , Atomic and Molecular Physics, and Optics

Indicator:

Year	P	IPP	SNIP	% self cit
1999	761	0.32	0.52	44.3%
2000	723	0.35	0.52	35.3%
2001	761	0.51	0.69	23.9%
2002	785	0.55	0.73	27.9%
2003	831	0.62	0.72	26.1%
2004	801	0.72	0.80	19.2%
2005	782	0.88	0.97	13.4%
2006	804	1.02	1.07	15.0%
2007	793	1.17	1.15	22.2%
2008	893	1.17	1.15	20.1%
2009	887	1.22	1.12	15.8%
2010	866	1.16	1.06	20.2%
2011	857	1.41	1.31	17.8%
2012	956	1.37	1.31	20.6%
2013	1173	1.27	1.18	14.5%
2014	1146	1.58	1.35	15.3%
2015	1194	1.59	1.13	15.8%
2016	1150	1.37	0.98	17.8%
2017	1254	1.27	0.91	17.6%
2018	1235	1.39	1.01	18.7%
2019	1347	1.54	0.96	11.0%
2020	1242	1.76	0.98	12.9%
2021	1182	1.58	0.85	11.4%
2022	994	1.56	0.79	11.6%